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All Products / Optics / Beamsplitters / Plate Beamsplitters / Elliptical Plate Beamsplitters
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TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. TECHSPEC® components are designed, specified, or manufactured by Edmund Optics. Learn More

25 x 35.36 x 1mm VIS, Elliptical Plate Beamsplitter

Elliptical Plate Beamsplitters

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Stock #48-915 3-5 days
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Quantity Selector - Use the plus and minus buttons to adjust the quantity. +
S$266.80
Qty 1-5
S$266.80
Qty 6+
S$239.25
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Clear Aperture (%):
>80
Coating:
VIS
Coating Specification:
Surface 1: 50R/50T (Rabs ±5% @ 550nm, Ravg ±10% @ 400 - 700nm)
Surface 2: Ravg ≤1.0%, Rabs ≤2.0% @ 400 - 700nm
Construction:
Plate
Edges:
Cut with 0.25mm Maximum Edge Chip
Major Axis (mm):
36.36 +0.0/-0.70 (physical length)
Minor Axis (mm):
25.00 +0.0/-0.10
Parallelism (arcmin):
<1
Reflection/Transmission Ratio (R/T):
50/50
Substrate: Many glass manufacturers offer the same material characteristics under different trade names. Learn More
N-BK7
Surface Flatness (P-V):
<2λ (per inch)
Surface Quality:
60-40
Thickness (mm):
1.00
Thickness Tolerance (mm):
±0.1
Type:
Standard Beamsplitter
Wavelength Range (nm):
400 - 700

Regulatory Compliance

RoHS 2015:
Compliant
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Certificate of Conformance:
View
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Reach 240:
Compliant
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Product Family Description

  • Circular Profile at 45°
  • Visible and NIR Coating Options Offered
  • Ideal for Diffuse Axial and In-line Illumination

TECHSPEC® Elliptical Plate Beamsplitters maximize beamsplitting efficiency while minimizing required mounting space. These beamsplitters are ideal for diffuse axial and in-line illumination. When oriented at 45°, the beamsplitters create a circular aperture equal to the diameter of the minor axis. TECHSPEC® Elliptical Plate Beamsplitters are available with either a visible or NIR 50% reflection/50% transmission beamsplitter coating and feature a high efficiency multi-layer anti-reflection (AR) coating to reduce back reflections. The beamsplitters are offered in either a 1 or 3mm thickness, in a range of major and minor axis measurements and wavelength ranges.